Improving Bias-Stress Stability of p‑Type Organic Field-Effect Transistors by Constructing an Electron Injection Barrier at the Drain Electrode/Semiconductor Interfaces - Yang, Zhenxin; Guo, Chunhua; Shi, Changsheng; Wang, Deng-Ke; Zhang, Tao; Zhu, Qiang; Lu, Zheng-Hong (ACS Applied Materials & Interfaces, 2020)