Xue, Q., Peng, Y., Cao, L., Xia, Y., Liang, J., Chen, C., . . . Hang, T. (2022). Ultralow Set Voltage and Enhanced Switching Reliability for Resistive Random-Access Memory Enabled by an Electrodeposited Nanocone Array. ACS Applied Materials & Interfaces, 14(22), 25710-25721. https://doi.org/10.1021/acsami.2c03978
Chicago-referens (17:e uppl.)Xue, Qi, Yan Peng, Liang Cao, Yuanyuan Xia, Jianghu Liang, Chun-Chao Chen, Ming Li, och Tao Hang. "Ultralow Set Voltage and Enhanced Switching Reliability for Resistive Random-Access Memory Enabled by an Electrodeposited Nanocone Array." ACS Applied Materials & Interfaces 14, no. 22 (2022): 25710-25721. https://doi.org/10.1021/acsami.2c03978.
MLA-referens (9:e uppl.)Xue, Qi, et al. "Ultralow Set Voltage and Enhanced Switching Reliability for Resistive Random-Access Memory Enabled by an Electrodeposited Nanocone Array." ACS Applied Materials & Interfaces, vol. 14, no. 22, 2022, pp. 25710-25721, https://doi.org/10.1021/acsami.2c03978.
