Zhang, J., Zhou, R., Fang, N. X., Deng, W., Zhu, J., & Liu, S. (2025). Experimental Demonstration of Conjugate Structured Illumination Microscopy (c-SIM) for Sensing Deep Subwavelength Perturbations in Background Nanopatterns. ACS Photonics, 12(5), 2710-2719. https://doi.org/10.1021/acsphotonics.5c00227
Chicago-referens (17:e uppl.)Zhang, Jinsong, Renjie Zhou, Nicholas X. Fang, Weijie Deng, Jinlong Zhu, och Shiyuan Liu. "Experimental Demonstration of Conjugate Structured Illumination Microscopy (c-SIM) for Sensing Deep Subwavelength Perturbations in Background Nanopatterns." ACS Photonics 12, no. 5 (2025): 2710-2719. https://doi.org/10.1021/acsphotonics.5c00227.
MLA-referens (9:e uppl.)Zhang, Jinsong, et al. "Experimental Demonstration of Conjugate Structured Illumination Microscopy (c-SIM) for Sensing Deep Subwavelength Perturbations in Background Nanopatterns." ACS Photonics, vol. 12, no. 5, 2025, pp. 2710-2719, https://doi.org/10.1021/acsphotonics.5c00227.
