Mabasa, V., Chude‐Okonkwo, U. A. K., & Paul, B. S. (2025). Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products. Engineering Reports, 7(5), . https://doi.org/10.1002/eng2.70191
Chicago-referens (17:e uppl.)Mabasa, Vutivi, Uche A. K. Chude‐Okonkwo, och Babu S. Paul. "Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products." Engineering Reports 7, no. 5 (2025). https://doi.org/10.1002/eng2.70191.
MLA-referens (9:e uppl.)Mabasa, Vutivi, et al. "Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products." Engineering Reports, vol. 7, no. 5, 2025, https://doi.org/10.1002/eng2.70191.
