APA-referens (7:e uppl.)

Hu, B., You, J., Huang, K., Xu, M., Liu, D., & Ma, S. (2025). EffTEE. IEEE Access, 13, 31423-31441. https://doi.org/10.1109/ACCESS.2025.3538712

Chicago-referens (17:e uppl.)

Hu, Bin, Junyong You, Kuan Huang, Meng Xu, Dan Liu, och Sugang Ma. "EffTEE." IEEE Access 13 (2025): 31423-31441. https://doi.org/10.1109/ACCESS.2025.3538712.

MLA-referens (9:e uppl.)

Hu, Bin, et al. "EffTEE." IEEE Access, vol. 13, 2025, pp. 31423-31441, https://doi.org/10.1109/ACCESS.2025.3538712.