Yue, H., Wang, R., Gao, Y., Xia, A., & Zhang, J. (2023). DSP-Based Industrial Defect Detection for Intelligent Manufacturing. 2023 26th International Conference on Computer Supported Cooperative Work in Design (CSCWD), Computer Supported Cooperative Work in Design (CSCWD), 2023 26th International Conference on, 1667-1672. https://doi.org/10.1109/CSCWD57460.2023.10152825
Chicago Style (17th ed.) CitationYue, Han, Rucen Wang, Yi Gao, Ailing Xia, and Jianhua Zhang. "DSP-Based Industrial Defect Detection for Intelligent Manufacturing." 2023 26th International Conference on Computer Supported Cooperative Work in Design (CSCWD), Computer Supported Cooperative Work in Design (CSCWD), 2023 26th International Conference on 2023: 1667-1672. https://doi.org/10.1109/CSCWD57460.2023.10152825.
MLA (9th ed.) CitationYue, Han, et al. "DSP-Based Industrial Defect Detection for Intelligent Manufacturing." 2023 26th International Conference on Computer Supported Cooperative Work in Design (CSCWD), Computer Supported Cooperative Work in Design (CSCWD), 2023 26th International Conference on, 2023, pp. 1667-1672, https://doi.org/10.1109/CSCWD57460.2023.10152825.