Importance of SAF Stability against Temperature and Magnetic Field in Automotive-Grade-1 STT-MRAM Wafer Electrical Testing - Hindenberg, Meike; Muller, Johannes; Durner, Christoph; Gurieva, Tatiana; Yoon, Hongsik; Titova, Aleksandra; Wolf, Georg; Otani, Yuichi; Wagner-Reetz, Maik (2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers), Magnetic Conference - Short Papers (INTERMAG Short Papers), 2023 IEEE International, 2023)