Galanakis, D., Lucho, S., Maravelakis, E., Bolanakis, N., Konstantaras, A., Vidakis, N., . . . Brunetaud, X. (2024). Segment Anything Model for Scan-to-Structural Analysis in Cultural Heritage. 2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE), Electronic Engineering, Information Technology & Education (EEITE), 2024 5th International Conference in, 1-7. https://doi.org/10.1109/EEITE61750.2024.10654401
Chicago-referens (17:e uppl.)Galanakis, Demitrios, et al. "Segment Anything Model for Scan-to-Structural Analysis in Cultural Heritage." 2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE), Electronic Engineering, Information Technology & Education (EEITE), 2024 5th International Conference in 2024: 1-7. https://doi.org/10.1109/EEITE61750.2024.10654401.
MLA-referens (9:e uppl.)Galanakis, Demitrios, et al. "Segment Anything Model for Scan-to-Structural Analysis in Cultural Heritage." 2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE), Electronic Engineering, Information Technology & Education (EEITE), 2024 5th International Conference in, 2024, pp. 1-7, https://doi.org/10.1109/EEITE61750.2024.10654401.
