APA (7th ed.) Citation

Fei, Y., Xie, B., Zhang, J., Jin, Y., Pan, Z., & Yuan, C. (2024). A New Improved YOLO Based Network for PCB Surface Defect Detection. 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on, 864-869. https://doi.org/10.1109/DOCS63458.2024.10704423

Chicago Style (17th ed.) Citation

Fei, Yihong, Binyang Xie, Jingya Zhang, Yixin Jin, Ziyi Pan, and Chenyue Yuan. "A New Improved YOLO Based Network for PCB Surface Defect Detection." 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on 2024: 864-869. https://doi.org/10.1109/DOCS63458.2024.10704423.

MLA (9th ed.) Citation

Fei, Yihong, et al. "A New Improved YOLO Based Network for PCB Surface Defect Detection." 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on, 2024, pp. 864-869, https://doi.org/10.1109/DOCS63458.2024.10704423.

Warning: These citations may not always be 100% accurate.