Fei, Y., Xie, B., Zhang, J., Jin, Y., Pan, Z., & Yuan, C. (2024). A New Improved YOLO Based Network for PCB Surface Defect Detection. 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on, 864-869. https://doi.org/10.1109/DOCS63458.2024.10704423
Chicago Style (17th ed.) CitationFei, Yihong, Binyang Xie, Jingya Zhang, Yixin Jin, Ziyi Pan, and Chenyue Yuan. "A New Improved YOLO Based Network for PCB Surface Defect Detection." 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on 2024: 864-869. https://doi.org/10.1109/DOCS63458.2024.10704423.
MLA (9th ed.) CitationFei, Yihong, et al. "A New Improved YOLO Based Network for PCB Surface Defect Detection." 2024 6th International Conference on Data-driven Optimization of Complex Systems (DOCS), Data-driven Optimization of Complex Systems (DOCS), 2024 6th International Conference on, 2024, pp. 864-869, https://doi.org/10.1109/DOCS63458.2024.10704423.