D2D Variation Aware DTCO for Novel Vertical a-IGZO-FETs in Large-Scale M3D 2TOC DRAM Bit Cell Evaluation via Statistical Modeling Methodology - Zhao, Yue; Yu, Yong; Guo, Jingrui; Wang, Lingfei; Yang, Nan; Jiang, Jianpeng; Lu, Yanan; Zhou, Menglong; Huang, Shijie; Xu, Lihua; Wu, Zhenhua; Yang, Guanhua; et al. (2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2024 International Conference on, 2024)