APA (7th ed.) Citation

Tan, Y., Gong, J., Li, S., Li, J., & Chen, W. (2025). Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition. IEEE Transactions on Dielectrics and Electrical Insulation, Dielectrics and Electrical Insulation, IEEE Transactions on, IEEE Trans. Dielect. Electr. Insul., 32(1), 92. https://doi.org/10.1109/TDEI.2024.3487820

Chicago Style (17th ed.) Citation

Tan, Y., J. Gong, S. Li, J. Li, and W. Chen. "Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition." IEEE Transactions on Dielectrics and Electrical Insulation, Dielectrics and Electrical Insulation, IEEE Transactions on, IEEE Trans. Dielect. Electr. Insul. 32, no. 1 (2025): 92. https://doi.org/10.1109/TDEI.2024.3487820.

MLA (9th ed.) Citation

Tan, Y., et al. "Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition." IEEE Transactions on Dielectrics and Electrical Insulation, Dielectrics and Electrical Insulation, IEEE Transactions on, IEEE Trans. Dielect. Electr. Insul., vol. 32, no. 1, 2025, p. 92, https://doi.org/10.1109/TDEI.2024.3487820.