Dai, Y., Zou, M., Li, Y., Li, X., Ni, K., & Yang, J. (2025). DenoDet. IEEE Transactions on Aerospace and Electronic Systems, Aerospace and Electronic Systems, IEEE Transactions on, IEEE Trans. Aerosp. Electron. Syst., 61(2), 4729. https://doi.org/10.1109/TAES.2024.3507786
Chicago Style (17th ed.) CitationDai, Y., M. Zou, Y. Li, X. Li, K. Ni, and J. Yang. "DenoDet." IEEE Transactions on Aerospace and Electronic Systems, Aerospace and Electronic Systems, IEEE Transactions on, IEEE Trans. Aerosp. Electron. Syst. 61, no. 2 (2025): 4729. https://doi.org/10.1109/TAES.2024.3507786.
MLA (9th ed.) CitationDai, Y., et al. "DenoDet." IEEE Transactions on Aerospace and Electronic Systems, Aerospace and Electronic Systems, IEEE Transactions on, IEEE Trans. Aerosp. Electron. Syst., vol. 61, no. 2, 2025, p. 4729, https://doi.org/10.1109/TAES.2024.3507786.