Niu, T., Yue, H., AlSkaif, T., Cui, M., & Wang, J. (2025). ETDS. IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., 21(3), 2114. https://doi.org/10.1109/TII.2024.3495734
Chicago-referens (17:e uppl.)Niu, T., H. Yue, T. AlSkaif, M. Cui, och J. Wang. "ETDS." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf. 21, no. 3 (2025): 2114. https://doi.org/10.1109/TII.2024.3495734.
MLA-referens (9:e uppl.)Niu, T., et al. "ETDS." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., vol. 21, no. 3, 2025, p. 2114, https://doi.org/10.1109/TII.2024.3495734.