Ko, S., Shim, J., Park, J. H., Lim, W., Jung, H., Bak, J. H., . . . Song, J. H. (2024). Key Technologies of Scaling Embedded MRAM to 8nm Logic and Beyond for Automotive Application. 2024 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2024 IEEE International, 1-4. https://doi.org/10.1109/IEDM50854.2024.10873495
Chicago-referens (17:e uppl.)Ko, S., et al. "Key Technologies of Scaling Embedded MRAM to 8nm Logic and Beyond for Automotive Application." 2024 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2024 IEEE International 2024: 1-4. https://doi.org/10.1109/IEDM50854.2024.10873495.
MLA-referens (9:e uppl.)Ko, S., et al. "Key Technologies of Scaling Embedded MRAM to 8nm Logic and Beyond for Automotive Application." 2024 IEEE International Electron Devices Meeting (IEDM), Electron Devices Meeting (IEDM), 2024 IEEE International, 2024, pp. 1-4, https://doi.org/10.1109/IEDM50854.2024.10873495.
