Wang, Z., Ma, Y., Gao, J., & Chen, H. (2025). Cured Memory RUL Prediction of Solid-State Batteries Combined Progressive-Topologia Fusion Health Indicators. IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., 21(5), 4051. https://doi.org/10.1109/TII.2025.3528576
Chicago-referens (17:e uppl.)Wang, Z., Y. Ma, J. Gao, och H. Chen. "Cured Memory RUL Prediction of Solid-State Batteries Combined Progressive-Topologia Fusion Health Indicators." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf. 21, no. 5 (2025): 4051. https://doi.org/10.1109/TII.2025.3528576.
MLA-referens (9:e uppl.)Wang, Z., et al. "Cured Memory RUL Prediction of Solid-State Batteries Combined Progressive-Topologia Fusion Health Indicators." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., vol. 21, no. 5, 2025, p. 4051, https://doi.org/10.1109/TII.2025.3528576.
