Reliability Modeling and Evaluation of Circuit Boards Considering Key Design Factors

Hu, Hailu, Wu, Jianguo, Zhang, Ruihao, Wen, Menlin

2025 11th International Symposium on System Security, Safety, and Reliability (ISSSR) ISSSR System Security, Safety, and Reliability (ISSSR), 2025 11th International Symposium on. :216-226 Apr, 2025

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Title	Reliability Modeling and Evaluation of Circuit Boards Considering Key Design Factors
Authors	Hu, Hailu, Wu, Jianguo, Zhang, Ruihao, Wen, Menlin
Source	2025 11th International Symposium on System Security, Safety, and Reliability (ISSSR) ISSSR System Security, Safety, and Reliability (ISSSR), 2025 11th International Symposium on. :216-226 Apr, 2025

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