Chen, Y., Hua, Y., Khoo, B. S., Leong, H., Bagulbagul, V., Wang, Y., . . . Li, X. (2016). Comprehensive physical and chemical characterization of the galvanic corrosion induced failures. 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the, 335-339. https://doi.org/10.1109/IPFA.2016.7564312
Chicago-referens (17:e uppl.)Chen, Yixin, et al. "Comprehensive Physical and Chemical Characterization of the Galvanic Corrosion Induced Failures." 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the 2016: 335-339. https://doi.org/10.1109/IPFA.2016.7564312.
MLA-referens (9:e uppl.)Chen, Yixin, et al. "Comprehensive Physical and Chemical Characterization of the Galvanic Corrosion Induced Failures." 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the, 2016, pp. 335-339, https://doi.org/10.1109/IPFA.2016.7564312.
