APA (7th ed.) Citation

Rao, C., Li, N., Lei, Y., Guo, J., Zhang, Y., Kacker, R., & Kuhn, D. (2022). Combinatorial Test Generation for Multiple Input Models With Shared Parameters. IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng., 48(7), 2606. https://doi.org/10.1109/TSE.2021.3065950

Chicago Style (17th ed.) Citation

Rao, C., N. Li, Y. Lei, J. Guo, Y. Zhang, R.N Kacker, and D.R Kuhn. "Combinatorial Test Generation for Multiple Input Models With Shared Parameters." IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng. 48, no. 7 (2022): 2606. https://doi.org/10.1109/TSE.2021.3065950.

MLA (9th ed.) Citation

Rao, C., et al. "Combinatorial Test Generation for Multiple Input Models With Shared Parameters." IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng., vol. 48, no. 7, 2022, p. 2606, https://doi.org/10.1109/TSE.2021.3065950.