Lin, D., Cao, Y., Zhu, W., & Li, Y. (2021). Few-Shot Defect Segmentation Leveraging Abundant Defect-Free Training Samples Through Normal Background Regularization And Crop-And-Paste Operation. 2021 IEEE International Conference on Multimedia and Expo (ICME), Multimedia and Expo (ICME), 2021 IEEE International Conference on, 1-6. https://doi.org/10.1109/ICME51207.2021.9428468
Chicago-referens (17:e uppl.)Lin, Dongyun, Yanpeng Cao, Wenbin Zhu, och Yiqun Li. "Few-Shot Defect Segmentation Leveraging Abundant Defect-Free Training Samples Through Normal Background Regularization And Crop-And-Paste Operation." 2021 IEEE International Conference on Multimedia and Expo (ICME), Multimedia and Expo (ICME), 2021 IEEE International Conference on 2021: 1-6. https://doi.org/10.1109/ICME51207.2021.9428468.
MLA-referens (9:e uppl.)Lin, Dongyun, et al. "Few-Shot Defect Segmentation Leveraging Abundant Defect-Free Training Samples Through Normal Background Regularization And Crop-And-Paste Operation." 2021 IEEE International Conference on Multimedia and Expo (ICME), Multimedia and Expo (ICME), 2021 IEEE International Conference on, 2021, pp. 1-6, https://doi.org/10.1109/ICME51207.2021.9428468.
