Lee, S., Wu, L., Chang, K., Huang, R., & Lin, J. (2021). New Implicit ESD Test Methodology and Simple Simulation Method for ESD Risk Evaluation. 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, EMC/SI/PI and EMC Europe Symposium, 2021 IEEE International Joint, 1149-1152. https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559230
Chicago-referens (17:e uppl.)Lee, Scott, Leo Wu, Kyle Chang, Ray Huang, och Joseph Lin. "New Implicit ESD Test Methodology and Simple Simulation Method for ESD Risk Evaluation." 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, EMC/SI/PI and EMC Europe Symposium, 2021 IEEE International Joint 2021: 1149-1152. https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559230.
MLA-referens (9:e uppl.)Lee, Scott, et al. "New Implicit ESD Test Methodology and Simple Simulation Method for ESD Risk Evaluation." 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, EMC/SI/PI and EMC Europe Symposium, 2021 IEEE International Joint, 2021, pp. 1149-1152, https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559230.
