Kim, S. Y., Zhang, J., Niklaus, S., Fan, Y., Chen, S., Lin, Z., & Kim, M. (2022). Layered Depth Refinement with Mask Guidance. 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Computer Vision and Pattern Recognition (CVPR), 2022 IEEE/CVF Conference on, CVPR, 3845-3855. https://doi.org/10.1109/CVPR52688.2022.00383
Chicago-referens (17:e uppl.)Kim, Soo Ye, Jianming Zhang, Simon Niklaus, Yifei Fan, Simon Chen, Zhe Lin, och Munchurl Kim. "Layered Depth Refinement with Mask Guidance." 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Computer Vision and Pattern Recognition (CVPR), 2022 IEEE/CVF Conference on, CVPR 2022: 3845-3855. https://doi.org/10.1109/CVPR52688.2022.00383.
MLA-referens (9:e uppl.)Kim, Soo Ye, et al. "Layered Depth Refinement with Mask Guidance." 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Computer Vision and Pattern Recognition (CVPR), 2022 IEEE/CVF Conference on, CVPR, 2022, pp. 3845-3855, https://doi.org/10.1109/CVPR52688.2022.00383.
