Zhang, R., Xu, H., Qu, Z., Zhang, X., Ai, X., & Zhang, Q. (2002). Investigation on the electronic structural properties associated with the oxidation damage to the telomeric ssDNA. Journal of Molecular Structure: THEOCHEM, 586(1), 167-175. https://doi.org/10.1016/S0166-1280(02)00085-4
Chicago Style (17th ed.) CitationZhang, Ru-Bo, Hong Xu, Zheng-Wang Qu, Xing-Kang Zhang, Xi-Cheng Ai, and Qi-Yuan Zhang. "Investigation on the Electronic Structural Properties Associated with the Oxidation Damage to the Telomeric SsDNA." Journal of Molecular Structure: THEOCHEM 586, no. 1 (2002): 167-175. https://doi.org/10.1016/S0166-1280(02)00085-4.
MLA (9th ed.) CitationZhang, Ru-Bo, et al. "Investigation on the Electronic Structural Properties Associated with the Oxidation Damage to the Telomeric SsDNA." Journal of Molecular Structure: THEOCHEM, vol. 586, no. 1, 2002, pp. 167-175, https://doi.org/10.1016/S0166-1280(02)00085-4.