A Factor Analysis Approach to Item Level Change Score Reliability - Molenaar, Dylan; Veldkamp, Bernard, Series Editor; von Davier, Matthias, Series Editor; Carstensen, Claus H., Editorial Board Member; Chang, Hua-Hua, Editorial Board Member; Jiao, Hong, Editorial Board Member; Kaplan, David, Editorial Board Member; Templin, Jonathan, Editorial Board Member; van der Ark, Andries, Editorial Board Member; van der Ark, L. Andries, editor; Emons, Wilco H. M., editor; Meijer, Rob R., editor (Essays on Contemporary Psychometrics, 2023)