Wan, J., He, R., Qiao, L., Qin, J., Miao, Y., Angrisani, L., . . . S. Shmaliy, Y. (2024). Characterization Parameters and Detection Technology of Conductor Stranding Structure Defects. 8th International Conference on Computing, Control and Industrial Engineering (CCIE2024) : Advances in Computing, Control and Industrial Engineering VIII (Volume 1), 1252, 171-179. https://doi.org/10.1007/978-981-97-6934-6_21
Chicago-referens (17:e uppl.)Wan, Jiancheng, et al. "Characterization Parameters and Detection Technology of Conductor Stranding Structure Defects." 8th International Conference on Computing, Control and Industrial Engineering (CCIE2024) : Advances in Computing, Control and Industrial Engineering VIII (Volume 1) 1252 (2024): 171-179. https://doi.org/10.1007/978-981-97-6934-6_21.
MLA-referens (9:e uppl.)Wan, Jiancheng, et al. "Characterization Parameters and Detection Technology of Conductor Stranding Structure Defects." 8th International Conference on Computing, Control and Industrial Engineering (CCIE2024) : Advances in Computing, Control and Industrial Engineering VIII (Volume 1), vol. 1252, 2024, pp. 171-179, https://doi.org/10.1007/978-981-97-6934-6_21.
