APA (7th ed.) Citation

Liu, K., Yang, Y., Yang, X., Wang, J., Liu, W., & Chen, H. (2025). Multi-level joint distributed alignment-based domain adaptation for cross-scenario strip defect recognition. Journal of Intelligent Manufacturing, 36(4), 2373-2386. https://doi.org/10.1007/s10845-024-02344-z

Chicago Style (17th ed.) Citation

Liu, Kun, Ying Yang, Xiaosong Yang, Jingkai Wang, Weipeng Liu, and Haiyong Chen. "Multi-level Joint Distributed Alignment-based Domain Adaptation for Cross-scenario Strip Defect Recognition." Journal of Intelligent Manufacturing 36, no. 4 (2025): 2373-2386. https://doi.org/10.1007/s10845-024-02344-z.

MLA (9th ed.) Citation

Liu, Kun, et al. "Multi-level Joint Distributed Alignment-based Domain Adaptation for Cross-scenario Strip Defect Recognition." Journal of Intelligent Manufacturing, vol. 36, no. 4, 2025, pp. 2373-2386, https://doi.org/10.1007/s10845-024-02344-z.