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Bibliographic Details
Source:
Journal of Electrical Engineering & Technology
. 20(4):2529-2536
Database:
Springer Nature Journals
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Authors:
Lee, Han Cheol
,
Im, Hwarim
,
Jeon, Jae-Hong
,
Moon, Kook Chul
Aff1, IDs4283502502157x_cor1
,
Kim, Yong-Sang
Aff1, IDs4283502502157x_cor2
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