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In Situ XRD Observation of Cry...
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Bibliographic Details
Source:
ACS Applied Electronic Materials
. 2(7):2084-2089
Database:
ACS Publications
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Authors:
Tan, Goon
aff1
,
Kweon, Sang Hyo
aff1
,
Shibata, Kenji
aff2
,
Yamada, Tomoaki
aff3, aff4
,
Kanno, Isaku
aff1
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