Stan, G., Ciobanu, C. V., & King, S. W. (2022). Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14(49), 55238-55248. https://doi.org/10.1021/acsami.2c17962
Chicago-referens (17:e uppl.)Stan, Gheorghe, Cristian V. Ciobanu, och Sean W. King. "Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy." ACS Applied Materials & Interfaces 14, no. 49 (2022): 55238-55248. https://doi.org/10.1021/acsami.2c17962.
MLA-referens (9:e uppl.)Stan, Gheorghe, et al. "Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy." ACS Applied Materials & Interfaces, vol. 14, no. 49, 2022, pp. 55238-55248, https://doi.org/10.1021/acsami.2c17962.
