APA (7th ed.) Citation

Stan, G., Ciobanu, C. V., & King, S. W. (2022). Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS Applied Materials & Interfaces, 14(49), 55238-55248. https://doi.org/10.1021/acsami.2c17962

Chicago Style (17th ed.) Citation

Stan, Gheorghe, Cristian V. Ciobanu, and Sean W. King. "Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy." ACS Applied Materials & Interfaces 14, no. 49 (2022): 55238-55248. https://doi.org/10.1021/acsami.2c17962.

MLA (9th ed.) Citation

Stan, Gheorghe, et al. "Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy." ACS Applied Materials & Interfaces, vol. 14, no. 49, 2022, pp. 55238-55248, https://doi.org/10.1021/acsami.2c17962.