APA (7th ed.) Citation

Zhang, W., Wang, Q., Shen, G., Fan, S., Fan, X., Yang, R., . . . Lv, F. (2025). Introducing deep trap states for high dielectric strength of aramid‐based composite films. High Voltage, 10(1), 197. https://doi.org/10.1049/hve2.12483

Chicago Style (17th ed.) Citation

Zhang, Wenqi, Qibin Wang, Guangyi Shen, Sidi Fan, Xiaozhou Fan, Rui Yang, Yunpeng Liu, Xiang Yu, and Fangcheng Lv. "Introducing Deep Trap States for High Dielectric Strength of Aramid‐based Composite Films." High Voltage 10, no. 1 (2025): 197. https://doi.org/10.1049/hve2.12483.

MLA (9th ed.) Citation

Zhang, Wenqi, et al. "Introducing Deep Trap States for High Dielectric Strength of Aramid‐based Composite Films." High Voltage, vol. 10, no. 1, 2025, p. 197, https://doi.org/10.1049/hve2.12483.