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Source: | IEEE Open Journal of Power Electronics, Vol 1, Pp 180-189 (2020) |
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Publisher Information: | IEEE, 2020. |
Publication Year: | 2020 |
Subject Terms: |
Open-circuit failure, failure diagnosis, modular multilevel converters, statistical analysis, Electrical engineering. Electronics. Nuclear e
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Description: |
Submodule (SM) open-circuit failures severely affect the reliable operation of modular multilevel converter (MMCs). A comprehensive SM open-
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Database: | Directory of Open Access Journals |