APA (7th ed.) Citation

Yue, H., Wang, R., Gao, Y., Xia, A., Su, K., & Zhang, J. (2024). Optimising digital signal processor‐based defect detection in smart manufacturing with lightweight convolutional neural networks. IET Collaborative Intelligent Manufacturing, 6(1), . https://doi.org/10.1049/cim2.12092

Chicago Style (17th ed.) Citation

Yue, Han, Rucen Wang, Yi Gao, Ailing Xia, Kaikai Su, and Jianhua Zhang. "Optimising Digital Signal Processor‐based Defect Detection in Smart Manufacturing with Lightweight Convolutional Neural Networks." IET Collaborative Intelligent Manufacturing 6, no. 1 (2024). https://doi.org/10.1049/cim2.12092.

MLA (9th ed.) Citation

Yue, Han, et al. "Optimising Digital Signal Processor‐based Defect Detection in Smart Manufacturing with Lightweight Convolutional Neural Networks." IET Collaborative Intelligent Manufacturing, vol. 6, no. 1, 2024, https://doi.org/10.1049/cim2.12092.