Yue, H., Wang, R., Gao, Y., Xia, A., Su, K., & Zhang, J. (2024). Optimising digital signal processor‐based defect detection in smart manufacturing with lightweight convolutional neural networks. IET Collaborative Intelligent Manufacturing, 6(1), . https://doi.org/10.1049/cim2.12092
Chicago-referens (17:e uppl.)Yue, Han, Rucen Wang, Yi Gao, Ailing Xia, Kaikai Su, och Jianhua Zhang. "Optimising Digital Signal Processor‐based Defect Detection in Smart Manufacturing with Lightweight Convolutional Neural Networks." IET Collaborative Intelligent Manufacturing 6, no. 1 (2024). https://doi.org/10.1049/cim2.12092.
MLA-referens (9:e uppl.)Yue, Han, et al. "Optimising Digital Signal Processor‐based Defect Detection in Smart Manufacturing with Lightweight Convolutional Neural Networks." IET Collaborative Intelligent Manufacturing, vol. 6, no. 1, 2024, https://doi.org/10.1049/cim2.12092.
