APA-referens (7:e uppl.)

Sheng, J., Qiu, M., Xu, P., Ding, L., Luo, Y., Yao, Z., . . . Xue, Y. (2024). Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation. AIP Advances, 14(2), . https://doi.org/10.1063/5.0188085

Chicago-referens (17:e uppl.)

Sheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances 14, no. 2 (2024). https://doi.org/10.1063/5.0188085.

MLA-referens (9:e uppl.)

Sheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances, vol. 14, no. 2, 2024, https://doi.org/10.1063/5.0188085.