Sheng, J., Qiu, M., Xu, P., Ding, L., Luo, Y., Yao, Z., . . . Xue, Y. (2024). Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation. AIP Advances, 14(2), . https://doi.org/10.1063/5.0188085
Chicago Style (17th ed.) CitationSheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances 14, no. 2 (2024). https://doi.org/10.1063/5.0188085.
MLA (9th ed.) CitationSheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances, vol. 14, no. 2, 2024, https://doi.org/10.1063/5.0188085.
Warning: These citations may not always be 100% accurate.