APA (7th ed.) Citation

Sheng, J., Qiu, M., Xu, P., Ding, L., Luo, Y., Yao, Z., . . . Xue, Y. (2024). Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation. AIP Advances, 14(2), . https://doi.org/10.1063/5.0188085

Chicago Style (17th ed.) Citation

Sheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances 14, no. 2 (2024). https://doi.org/10.1063/5.0188085.

MLA (9th ed.) Citation

Sheng, Jiangkun, et al. "Estimation Method for Bit Upset Ratio of NAND Flash Memory Induced by Heavy Ion Irradiation." AIP Advances, vol. 14, no. 2, 2024, https://doi.org/10.1063/5.0188085.

Warning: These citations may not always be 100% accurate.