APA-referens (7:e uppl.)

Lourembam, J., Huang, J., Lim, S. T., & Gerard, E. F. (2018). Role of CoFeB thickness in electric field controlled sub-100 nm sized magnetic tunnel junctions. AIP Advances, 8(5), . https://doi.org/10.1063/1.5006368

Chicago-referens (17:e uppl.)

Lourembam, James, Jiancheng Huang, Sze Ter Lim, och Ernult Franck Gerard. "Role of CoFeB Thickness in Electric Field Controlled Sub-100 Nm Sized Magnetic Tunnel Junctions." AIP Advances 8, no. 5 (2018). https://doi.org/10.1063/1.5006368.

MLA-referens (9:e uppl.)

Lourembam, James, et al. "Role of CoFeB Thickness in Electric Field Controlled Sub-100 Nm Sized Magnetic Tunnel Junctions." AIP Advances, vol. 8, no. 5, 2018, https://doi.org/10.1063/1.5006368.