Zhu, X. (2023). A Lightweight Improved Yolov5 for Insulator Defect Detection. 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on, 675-678. https://doi.org/10.1109/CEI60616.2023.10528051
Chicago-referens (17:e uppl.)Zhu, Xinping. "A Lightweight Improved Yolov5 for Insulator Defect Detection." 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on 2023: 675-678. https://doi.org/10.1109/CEI60616.2023.10528051.
MLA-referens (9:e uppl.)Zhu, Xinping. "A Lightweight Improved Yolov5 for Insulator Defect Detection." 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on, 2023, pp. 675-678, https://doi.org/10.1109/CEI60616.2023.10528051.
