APA (7th ed.) Citation

Zhu, X. (2023). A Lightweight Improved Yolov5 for Insulator Defect Detection. 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on, 675-678. https://doi.org/10.1109/CEI60616.2023.10528051

Chicago Style (17th ed.) Citation

Zhu, Xinping. "A Lightweight Improved Yolov5 for Insulator Defect Detection." 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on 2023: 675-678. https://doi.org/10.1109/CEI60616.2023.10528051.

MLA (9th ed.) Citation

Zhu, Xinping. "A Lightweight Improved Yolov5 for Insulator Defect Detection." 2023 3rd International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI), 2023 3rd International Conference on, 2023, pp. 675-678, https://doi.org/10.1109/CEI60616.2023.10528051.

Warning: These citations may not always be 100% accurate.