APA-referens (7:e uppl.)

Mishra, A., Kumar, S., Lingamoorthy, A., Das, A., & Kandasamy, N. (2024). Wafer2Spike. 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC, 16-20. https://doi.org/10.1109/ITC51657.2024.00011

Chicago-referens (17:e uppl.)

Mishra, Abhishek, Suman Kumar, Anush Lingamoorthy, Anup Das, och Nagarajan Kandasamy. "Wafer2Spike." 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC 2024: 16-20. https://doi.org/10.1109/ITC51657.2024.00011.

MLA-referens (9:e uppl.)

Mishra, Abhishek, et al. "Wafer2Spike." 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC, 2024, pp. 16-20, https://doi.org/10.1109/ITC51657.2024.00011.