APA (7th ed.) Citation

Mishra, A., Kumar, S., Lingamoorthy, A., Das, A., & Kandasamy, N. (2024). Wafer2Spike. 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC, 16-20. https://doi.org/10.1109/ITC51657.2024.00011

Chicago Style (17th ed.) Citation

Mishra, Abhishek, Suman Kumar, Anush Lingamoorthy, Anup Das, and Nagarajan Kandasamy. "Wafer2Spike." 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC 2024: 16-20. https://doi.org/10.1109/ITC51657.2024.00011.

MLA (9th ed.) Citation

Mishra, Abhishek, et al. "Wafer2Spike." 2024 IEEE International Test Conference (ITC), Test Conference (ITC), 2024 IEEE International, ITC, 2024, pp. 16-20, https://doi.org/10.1109/ITC51657.2024.00011.