Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification

Mishra, Abhishek, Kumar, Suman, Lingamoorthy, Anush, Das, Anup, Kandasamy, Nagarajan

2024 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2024 IEEE International. :16-20 Nov, 2024

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Bibliographic Details
Title	Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
Authors	Mishra, Abhishek, Kumar, Suman, Lingamoorthy, Anush, Das, Anup, Kandasamy, Nagarajan
Source	2024 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2024 IEEE International. :16-20 Nov, 2024

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