APA-referens (7:e uppl.)

Ceylan, E., Kutlubay, F., & Bener, A. (2006). Software Defect Identification Using Machine Learning Techniques. 32nd EUROMICRO Conference on Software Engineering and Advanced Applications (EUROMICRO'06), Software Engineering and Advanced Applications, 2006. SEAA '06. 32nd EUROMICRO Conference on, 240-247. https://doi.org/10.1109/EUROMICRO.2006.56

Chicago-referens (17:e uppl.)

Ceylan, E., F.O Kutlubay, och A.B Bener. "Software Defect Identification Using Machine Learning Techniques." 32nd EUROMICRO Conference on Software Engineering and Advanced Applications (EUROMICRO'06), Software Engineering and Advanced Applications, 2006. SEAA '06. 32nd EUROMICRO Conference on 2006: 240-247. https://doi.org/10.1109/EUROMICRO.2006.56.

MLA-referens (9:e uppl.)

Ceylan, E., et al. "Software Defect Identification Using Machine Learning Techniques." 32nd EUROMICRO Conference on Software Engineering and Advanced Applications (EUROMICRO'06), Software Engineering and Advanced Applications, 2006. SEAA '06. 32nd EUROMICRO Conference on, 2006, pp. 240-247, https://doi.org/10.1109/EUROMICRO.2006.56.

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