The breakdown characteristics of a new SOI high voltage device with Sandwich Buried oxide layer

Taijun Wang, Xiaorong Luo

2009 International Conference on Communications, Circuits and Systems Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on. :608-610 Jul, 2009

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Title	The breakdown characteristics of a new SOI high voltage device with Sandwich Buried oxide layer
Authors	Taijun Wang, Xiaorong Luo
Source	2009 International Conference on Communications, Circuits and Systems Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on. :608-610 Jul, 2009

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