Chen, Y., Wang, Z., Ma, Q., & Liang, K. (2019). Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects. IEEE/ASME Transactions on Mechatronics, Mechatronics, IEEE/ASME Transactions on, IEEE/ASME Trans. Mechatron., 24(6), 2441. https://doi.org/10.1109/TMECH.2019.2950893
Chicago-referens (17:e uppl.)Chen, Y., Z. Wang, Q. Ma, och K. Liang. "Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects." IEEE/ASME Transactions on Mechatronics, Mechatronics, IEEE/ASME Transactions on, IEEE/ASME Trans. Mechatron. 24, no. 6 (2019): 2441. https://doi.org/10.1109/TMECH.2019.2950893.
MLA-referens (9:e uppl.)Chen, Y., et al. "Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects." IEEE/ASME Transactions on Mechatronics, Mechatronics, IEEE/ASME Transactions on, IEEE/ASME Trans. Mechatron., vol. 24, no. 6, 2019, p. 2441, https://doi.org/10.1109/TMECH.2019.2950893.
