Tamura, Y., Yamada, S., & Pham, H. (2024). Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment. Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment, 81-149. https://doi.org/10.1007/978-3-031-64803-8_8
Chicago Style (17th ed.) CitationTamura, Yoshinobu, Shigeru Yamada, and Hoang Pham. "Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment." Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment 2024: 81-149. https://doi.org/10.1007/978-3-031-64803-8_8.
MLA (9th ed.) CitationTamura, Yoshinobu, et al. "Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment." Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment, 2024, pp. 81-149, https://doi.org/10.1007/978-3-031-64803-8_8.