Tamura, Y., Yamada, S., & Pham, H. (2024). Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment. Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment, 81-149. https://doi.org/10.1007/978-3-031-64803-8_8
Chicago-referens (17:e uppl.)Tamura, Yoshinobu, Shigeru Yamada, och Hoang Pham. "Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment." Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment 2024: 81-149. https://doi.org/10.1007/978-3-031-64803-8_8.
MLA-referens (9:e uppl.)Tamura, Yoshinobu, et al. "Deep Learning Method Based on Fault Big Data Analysis for OSS Reliability Assessment." Applied OSS Reliability Assessment Modeling, AI and Tools : Mathematics and AI for OSS Reliability Assessment, 2024, pp. 81-149, https://doi.org/10.1007/978-3-031-64803-8_8.
