Heiter, E., Martens, L., Seurinck, R., Guilliams, M., De Bie, T., Saeys, Y., . . . Žliobaitė, I. (2024). Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE. Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track : European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII, 14948, 379-382. https://doi.org/10.1007/978-3-031-70371-3_24
Chicago-referens (17:e uppl.)Heiter, Edith, et al. "Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE." Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track : European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII 14948 (2024): 379-382. https://doi.org/10.1007/978-3-031-70371-3_24.
MLA-referens (9:e uppl.)Heiter, Edith, et al. "Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE." Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track : European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII, vol. 14948, 2024, pp. 379-382, https://doi.org/10.1007/978-3-031-70371-3_24.
