Sun, X., Li, Y., Niu, S., & Huang, Y. (2015). The detecting system of image forgeries with noise features and EXIF information. Journal of Systems Science and Complexity, 28(5), 1164-1176. https://doi.org/10.1007/s11424-015-4023-2
Chicago-referens (17:e uppl.)Sun, Xiaoting, Yezhou Li, Shaozhang Niu, och Yanli Huang. "The Detecting System of Image Forgeries with Noise Features and EXIF Information." Journal of Systems Science and Complexity 28, no. 5 (2015): 1164-1176. https://doi.org/10.1007/s11424-015-4023-2.
MLA-referens (9:e uppl.)Sun, Xiaoting, et al. "The Detecting System of Image Forgeries with Noise Features and EXIF Information." Journal of Systems Science and Complexity, vol. 28, no. 5, 2015, pp. 1164-1176, https://doi.org/10.1007/s11424-015-4023-2.
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