Skip to content
Feedback
Login
Language
English
Svenska
Finn — The Libraries' Search Tool
Beta
Find
Advanced
High-Throughput Measurement of...
Loading…
View in EDS
Cite this
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
Saved in:
Bibliographic Details
Source:
Journal of Electronic Materials
. 53(4):2040-2049
Database:
Springer Nature Journals
Show other fields
Authors:
Xiao, Jinkun
,
Zhang, Zhenzhong
,
Chen, Juan
Aff1, Aff2, IDs11664024109410_cor3
,
Zhang, Lijun
Holdings
Close