Zhang, C., He, Y., Yang, T., Zhang, B., & Wu, J. (2022). An Analog Circuit Fault Diagnosis Approach Based on Improved Wavelet Transform and MKELM. Circuits, Systems, and Signal Processing, 41(3), 1255-1286. https://doi.org/10.1007/s00034-021-01842-2
Chicago Style (17th ed.) CitationZhang, Chaolong, Yigang He, Ting Yang, Bo Zhang, and Jing Wu. "An Analog Circuit Fault Diagnosis Approach Based on Improved Wavelet Transform and MKELM." Circuits, Systems, and Signal Processing 41, no. 3 (2022): 1255-1286. https://doi.org/10.1007/s00034-021-01842-2.
MLA (9th ed.) CitationZhang, Chaolong, et al. "An Analog Circuit Fault Diagnosis Approach Based on Improved Wavelet Transform and MKELM." Circuits, Systems, and Signal Processing, vol. 41, no. 3, 2022, pp. 1255-1286, https://doi.org/10.1007/s00034-021-01842-2.